Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin
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By: Springer
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Customer Reviews:
Total reviews: 4
Average rating: 5.0 of 5
Excellent resource for Electron Microscopists 5 out of 5 stars.
11 of 11 people found this review helpful.
This book, although not the newest textbook on the market, is THE textbook to have if you are looking for the history, theory or applications of electron microscopy and x-ray microanalysis. Well written, thorough and packed full of well-designed diagrams illustrating the principles described. I've used this textbook in classroom and laboratory settings with excellent results. Looking forward to the next edition!
Excellent text 5 out of 5 stars.
5 of 5 people found this review helpful.
Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference. When I took SEM at NC State University, it was taught from this book. Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything!
If you get one SEM book, get this one.
A very good text book to own 5 out of 5 stars.
3 of 3 people found this review helpful.
This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.